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Conferences > BICOP > 2023 > Th4B > Th4B.4

Characterisation of Mode Field Diameter for “Quantum-Grade” Interconnects

R. A. Ferguson, J. Felix, and S. R. G. Hall

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Abstract

The paper describes the characterization of “quantum-grade” interconnects using Mode Field Diameter as a figure of merit. We discuss the metrology needs for Quantum Network interconnects, supporting the development of commercially relevant traceable standards.

© 2023 The Author(s)

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