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Characterization of Ten-Mode EDFA Using Swept Wavelength Interferometer and Digital Holography

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Abstract

We characterize the spatially and spectrally resolved gain profiles of a ten-mode EDFA over C+L band via Rayleigh backscattering measured by a coherent swept wavelength interferometer. Wavelength-dependent mode-dependent gain is characterized employing digital holography.

© 2024 The Author(s)

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