Abstract
The damaged region of a failed semiconductor laser diode was analyzed using FIB nanotomography and 3D TOF-SIMS. Gold, a deep level trap, was found between the antireflective coating and the semiconductor facet.
© 2007 Optical Society of America
PDF ArticleMore Like This
D. A. Francis and C. J. Chang-Hasnain
CThK41 Conference on Lasers and Electro-Optics (CLEO:S&I) 1996
Brendan Foran, Nathan Presser, Yongkun Sin, Maribeth Mason, and Steve C. Moss
CWF5 Conference on Lasers and Electro-Optics (CLEO:S&I) 2009
jian Yang and Daniel T. Cassidy
CWH19 Conference on Lasers and Electro-Optics (CLEO:S&I) 1994