Fast and high-accuracy collinear reflection Mueller imaging polarimeter implemented with the compound calibration method

Xiang Ma, Jinxian Wu, Yujie Hu, and Yanqiu Li

Appl. Opt. 63(13), 3381-3389 (2024)  View: HTML | PDF

Cryogenic focus measurement system for a wide-field infrared space telescope

Samuel S. Condon, Stephen Padin, James Bock, Howard Hui, Phillip Korngut, Chi Nguyen, and Jordan Ostby

Appl. Opt. 63(13), 3453-3461 (2024)  View: HTML | PDF

Research and application of the wavelet high-frequency coefficient direct mapping algorithm in the micro-defect target detection system of an infrared objective lens

Youtang Gao, Hua Wen, Hongying Mei, and Jiaxian Zhang

Appl. Opt. 63(13), 3489-3494 (2024)  View: HTML | PDF

Measurement technology based on a Stokes parametric polarization system

Zhenmin Zhu, Hongwei Qiu, Wenqing Long, Lifa He, Dongdong Xie, and Yinsong Ye

Appl. Opt. 63(13), 3495-3505 (2024)  View: HTML | PDF

Parameter selection on a multi-exposure fusion method for measuring surfaces with varying reflectivity in microscope fringe projection profilometry

Junlin Du, Fan Yang, Hong Guo, Jiangping Zhu, and Pei Zhou

Appl. Opt. 63(13), 3506-3517 (2024)  View: HTML | PDF

Accuracy enhancement and joint calibration method of multi-station triangulation network based on absolute ranging

Shuo Yang, Linghui Yang, Tengfei Wu, Shendong Shi, Luyao Ma, and Jigui Zhu

Appl. Opt. 63(13), 3547-3556 (2024)  View: HTML | PDF

Highly precise thickness measurement of multilayer films based on the cross-correlation algorithm using a widely tunable MG-Y laser

Yang Cheung, Zhenguo Jing, Ang Li, Pengdong Cao, Da-Peng Zhou, and Wei Peng

Appl. Opt. 63(13), 3570-3575 (2024)  View: HTML | PDF

Accurate internal cavities and kissing bond sizing in metal plates by using the time-of-flight of laser-induced ultrasound waves

M. Rojas-Romero, O. Medina-Cázares, F. J. García-Rodríguez, A. González-Vega, G. Martínez-Ponce, and G. Gutiérrez-Juárez

Appl. Opt. 63(13), 3641-3647 (2024)  View: HTML | PDF